HP8000S CCD Fast Scan Spectrometer with Double Photo-Detectors
2.Optical fiber with connectors
3.Standard Light Source
4.Integrating spheres
5.Digital Power Meter
6.Standard Instrument Cabinet
A、APPLICATION
1. With the help of small integrating sphere (0.3m) to judge the performance of DIP LED, SMD LED and Power LED.
2. Work with the big integrating sphere(1.5m)to test the photometric and colorimetric parameters of light fixtures.
B、FEATURES:
1. Run under the Windows XP, Window 98 operation system.
2. SMA905 fiber connector and CCD fast canning speed.
3. Connect with computer to save the data as PDF file or Excel file for analysis purpose.
4. A set of mainframe cooperate with power meter, AC power source, integrating sphere and etc. can completely fulfill the testing about photometry, colorimetry and electricity.
5. The system is not only suitable for labs, QC departments and R&D departments, but also for production line.
C、CHRACTERISTICS AND SPECIFICATIONS
The system can determine spectral power distribution, chromaticity coordinates, correlated color temperature (CCT), color rending index, SDCM, peak wavelength, spectral half width, dominant wavelength, color purity, luminous flux and etc.
1. Test speed:5ms-2s;
2. Range of wavelength: 380~780nm;
3. Accuracy of wavelength: ±0.3nm;
4. Accuracy of chromaticity coordinates: ±0.0015(x, y);
5. Range of dominant wavelength: 380~780nm;
6. Accuracy of dominant wavelength: ±1.5nm;
7. Correlative color temperature: 1000K—100000K, resolution: 1K
8. Range of luminous intensity: 10mcd~3000cd (available with optical device)
9. Range of luminous intensity: 10mlm~20000lm(depending on the size of sphere);
10. Accuracy of electrical parameters: ±5%;
11. Accuracy of photometry: class1.
12. Range of forward current(IF):0.01mA~5000.0mA;
13. Range of forward voltage(VF):0.01~40.00V;
14. Range of reverse current(IR):0.01μA~200μA;
15. Range of reverse voltage(VR):0.01~30.00V;
16. A high degree of intelligent instruments with high stability and repeatability, it is completely satisfied with CIE measurement requirement;